ALTRACE

Energy Dispersive X-ray Fluorescence Spectrometer

ALTRACE Shimadzu detecting heavy metal

Detecting heavy metal with confidence

A combination of optical system design and Shimadzu's proprietary high-speed signal processing technology allows ALTRACE to reach new heights in terms of sensitivity.

Direct measurement from 0.1 ppm to several percent without sample preparation. Detect down to 0.1 ppm for Cd and Pb with a high-sensitivity 100 W source and get results within minutes. Process up to 48 samples per run, with racks that can be exchanged during measurement for continuous operation. Low running costs and easy handling with no specialist required, plus seamless integration with LabSolutions EDX, streamline routine analysis.

 

 

  • Discover the new Shimadzu ALTRACE

    • Ultra-trace Detection (0.1 ppm Cd, Pb)
      Measures heavy metals directly, from trace levels to several percent
    • High Throughput (48 samples per run)
      Sample racks can be exchanged during measurement for continuous operation
    • Fast, Cimple and Cost-Efficient
      Non-destructive results in minutes, with minimal running costs and no complex prep

     
  • altrace shimadzu metal detection

 

 


 

Trace metal in minutes — talk to our team!

 


 

 

 

Download: Full Product Brochure — New AGS‑V Series

altrace shimadzu metal detection

 

 

Explore the ALTRACE brochure to see how Shimadzu’s benchtop ED‑XRF sets a new benchmark in routine elemental analysis. Download the brochure for specifications, compliance features, and software integration.

 

 

 

Features

Unparalleled Sensitivity that Goes Beyond Typical Measurement Needs

With Shimadzu’s combination of optical system design and proprietary high-speed signal processing, ALTRACE reaches the highest detection sensitivity compared to Shimadzu’s general-purpose systems (EDX-7200). 

  • The combination of optical system that optimally arranges high-power X-ray tube and high-sensitivity detector, and high-speed signal processing has achieved high detection efficiency.
    In the analysis of aqueous solution samples, the detection limit for all elements have been improved compared to the conventional equipment (EDX-7200).
    It can be used effectively for the analysis of low-concentration samples and the automatic analysis of multiple samples requiring shorter measurement time.

  • Comparison of detection limit between conventional equipment (EDX-7200) and ALTRACE

    Comparison of detection limit between conventional
    equipment (EDX-7200) and ALTRACE

Unparalleled Sensitivity that Goes Beyond Typical Measurement Needs

 

 

 

Implements batch element analysis across a wide range from the sub ppm level to the % level

Implements batch element analysis across a wide range from the sub ppm level to the % level

 

Automatic Filter Exchange Improves Sensitivity



  • Background removal is facilitated by a primary X-ray filter, thereby improving S/N ratio. For trace-level analysis, where background is not negligible, filters are particularly advantageous.
    ALTRACE is equipped with 6 primary filters (8 types, including open and attenuator), which can be exchanged autonomously by the software.
  •   Effective Energy (keV) Example of Applicable Elements
    Filter #1 14 to 38 Mo,Rh,Pd,Ag,Cd,Sn,Sb
    Filter #2 2 to 4 S,Cl
    Filter #3 5 to 10 r,Mn,Fe,Co,Ni
    Filter #4 9 to 10 Hg
    Filter #5 9 to 14 As,Br,Zr,Hg,Pb,Bi
    Filter #6 4 to 5 Ti,V

 

 

Automatic Filter Exchange Improves Sensitivity

 

Escape from Complicated Pretreatment

When performing quantitative analysis by specifying elements, once a calibration curve is created, there is no need to recreate the calibration curve for each measurement. In addition, ALTRACE is suitable for simple screening analysis, since qualitative and quantitative analysis using the fundamental-parameter (FP) method can be performed without specifying elements Liquids and powders can be directly measured by simply placing them as is in the sample cell. EDX is a non-destructive technique; therefore, the same sample can be measured for both simple screening and precision analysis. To date, previous EDX systems could not measure concentrations on the order of 0.1 ppm. With ALTRACE, this level is now detectable. It is now possible to obtain sub-ppm level detection, without the need for chemical pretreatment.

Simple Screening in Combination with Precision Analysis

Solids, Powders and Liquids Can Be Measured As Is

With ALTRACE, samples are placed into a dedicated sample cell. The sample is supported by a transparent X-ray film that is suitable for the sample.

  • Powdered Samples and Pellet Samples

    Powder and pellet samples are placed in the sample cell and supported with polypropylene film.
    Powdered Samples and Pellet Samples
  • Liquid Samples (Water Soluble and Oleaginous)

    Aqueous solutions are poured into the sample cell and supported on a polypropylene film. Other liquids, such as organic solvents, can be measured by using an appropriate film.
    Liquid Samples (Water Soluble and Oleaginous)

 

 

High Throughput and Efficiency

 

Automatic Consecutive Analyses of Up to 48 Samples

Automatic Consecutive Analyses of Up to 48 Samples

710mm wide main body is equipped with a multi-sample changer. The tray drawer system allows for safe sample replacement without having to access the inside of the instrument.

Analysis can be Paused and Reassigned, Increasing Flexibility

Analysis can be Paused and Reassigned, Increasing Flexibility

During analysis, ALTRACE can be paused, and new samples can be added and the analysis schedule adjusted accordingly. As such, there is no need to wait for analysis to be completed to start sample preparation.


 

Request a quote today — talk to our team!

 


 

 

Explore more solutions for your analysis

Explore related products to find the right technique and capacity for your samples and regulations.

 

 

ALTRACE is a trademark of Shimadzu Corporation or its affiliated companies in Japan and/or other countries.
Intel and intel Core are trademarks of Intel Corporation or its subsidiaries.
Windows is either a registered trademark or a trademark of Microsoft Corporation in the United States and/or other countries.

 

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